ANGLE SYSTEMS
Angle Systems is a US company based in California that designs, fabricates and markets state-of-the-art, non-contact, high-precision optical inspection & measurement systems using Machine Vision and Laser technology, for various markets and applications. Angle Systems specializes in Metrology, Inspection and Automation system solutions for various manufacturing and R&D facilities. We have our standard products that cater to the Wire and Cable, Semiconductor and Bottling industries. Some of these products could also be used in high precision metrology applications. Apart from our standard products, we develop custom metrology and inspection solutions. We also tailor our standard solutions to fit specific customer requirements. Our area of expertise is in the development of cost effective Machine Vision, Laser Metrology, Inspection Systems and Hardware/Software Integration.
FOUNDER
Ananda Mysore MS in Metrology, UNC, North Carolina
Founded in 2009 in Mountain View, California
- over 10 patents and publications in peer-reviewed journals
- Past member of ANSI/ASME B89 Standards Committee (Video Metrology and Laser Probes)
- 25+ years experience in field of precision Metrology
- 15+ years experience as a machine design expert in Metrology using Vision, Laser, and motion control technology
MISSION STATEMENT
Our goal is to provide customers with the best-in-class, automated, non-contact inspection and measurement systems that improve productivity and accuracy in quantum leaps.
LOCATION
Angle Systems is located in the heart of Silicon Valley, California. All of our engineers are specialized in various fields. We are committed to excellent service, reliable products and highest customer satisfaction.
MARKET SEGMENT
Wire & Cable (extruded plastic, metal)
- Measurements: wire and cable type, wall-thicknesses
Biomedical (single/multi-lumen catheters)
- Measurements: lumen diameter, lumen wall-thicknesses, width, angle
Rubber and Tubing (safety hoses, drip-molded end-caps)
- Measurements: wall-thickness, angle, “pass/fail” check
Semiconductor (3D wafer thickness & defect mapping)
- Measurements: visual 3D maps with dimensions
General Metrology (machine vision combined with machine learning / artificial intelligence)
- Measurements: GD&T, defect inspection and identification
Custom Orders - Consult customers to custom-develop products for their applications using various sensing
technologies, computer data acquisition and statistical analysis.
